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Related to Atomic force microscope: scanning electron microscope


American Federation of Musicians of the United States and Canada

A labor union for North American musicians. It lobbies and negotiates contracts for better pay and working conditions. It also attempts to protect copyrights for musicians' intellectual property. It was established in 1896 by members of the American Federation of Labor (now the AFL-CIO).

Amman Financial Market

A securities exchange in Jordan. It was established in 1976 and traded in stocks, government and corporate bonds, and negotiable certificates of deposit, among other securities. It was the only exchange in Jordan and was replaced by the Amman Stock Exchange in 1999.
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Although the scanning electron microscope was able to show virus particles in the process of extruding (Figure 2B, Figure 3A and B) from the cells, the image derived with the atomic force microscope was superior in resolution.
the training will take place immediately after the installation and start an atomic force microscope (afm).
This contract is for the manufacture, delivery and installation of an atomic force microscope (AFM) coupled to a fluorescence light microscope right for the purposes of the joint research unit of the Galen Institute Paris south.
and twenty years of experience with Atomic Force Microscope (AFM) technology, Park Systems is dedicated to enabling developments in research, analysis, process and product manufacturing.
Durham University is looking to purchase an Atomic Force Microscope (AFM).
The School of Electronic and Electrical Engineering at the University of Leeds is seeking tenders for an Atomic Force Microscope primarily for high frame rate and high resolution imaging of biological molecules in both air and fluids.
Like a record needle, the sharp probe of an atomic force microscope (AFM) scans the surface of a material, tracing out the hills and valleys of the molecular landscape.
Contract notice: UCAM 045/14 Atomic Force Microscope System.
The tug-of-war relies on an atomic force microscope (SN: 10/24/98, p.
This patent relates to the use of an atomic force microscope (AFM) in Tapping Mode(TM) with phase or frequency detection to image the topography and surface characteristics of a sample.
Contract notice: Providing an atomic force microscope (afm)
The innovators start from Rohrer and Binnig's basic concepts, now embodied in the two main types of scanning probe microscopes: the STM and the atomic force microscope (AFM).